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About Us

JAMES HARPER

Professor, Physics Department, Materials Science Program

(603) 862-1962
E-mail: james.harper@unh.edu

Expertise:

Materials science of thin films and electronic materials , Condensed matter physics, Silicon chip interconnections and contacts, Ion beam modification of materials and surfaces, Low temperature physics, Industrial research and development

 

Professional Interests:

Thin film materials science. Synthesis of multicomponent thin films using a combination of plasma deposition and low energy ion bombardment. Modification of composition, morphology and microstructure to optimize the properties for specific applications, including electronic materials, hard coatings and interactions of molecules with surfaces.

 

Education:

1975

Ph.D. in Applied Physics, Stanford University, Stanford, California

1968

B.A. in Physics, Harvard University, Cambridge, Massachusetts Cum Laude

 

Publications:

2002

Picosecond Ultrasonic Study of the Vibrational Modes of a Nanostructure
G.A. Antonelli, H.J. Maris, S.G. Malhotra, J.M.E. Harper
J. Appl. Phys. 91, 3261 (2002)

2002

Effects of Alloying Elements on Cobalt Silicide Formation
C. Lavoie, C. Cabral Jr., F.M. d’Heurle, J.L. Jordan-Sweet, J.M.E. Harper
J. Elec. Mat. 31, 597 (2002)

2001

In situ Resistivity Study of Copper-Cobalt Films: Precipitation, Dissolution and Phase Transformation
S.L. Zhang, J.M.E. Harper, C. Cabral Jr., F.M. d’Heurle
Thin Solid Films 401, 298 (2001)

2000

Mechanisms for Enhanced Formation of the C54 Phase of Titanium Silicide Ultra-Large-Scale Integration Contacts
J.M.E. Harper, C. Cabral Jr., C. Lavoie
Ann. Rev. Mat. Sci. 30, 523 (2000)

2000

Detection of Cobalt Silicide Phase Formations by Ultrafast Optical Measurements
C. Lavoie, C. Cabral Jr., J.M.E. Harper, G. Tas, C.J. Morath, R.J. Stoner, H.J. Maris
Thin Solid Films 374, 42 (2000)

1999

Optimization of Ta-Si-N Thin Films for Use as Oxidation-Resistant Diffusion Barriers
C. Cabral Jr., K.L. Saenger, D.E. Kotecki, J.M.E. Harper, J. Mater
Res. 15, 194 (1999)

1999

Mechanisms for Microstructure Evolution in Electroplated Copper Thin Films Near Room Temperature
J.M.E. Harper, C. Cabral Jr., P.C. Andricacos, L. Gignac, I.C. Noyan, K.P. Rodbell, C.K. Hu
J. Appl. Phys. 86, 2516 (1999)

1998

Interdiffusion and Phase Formation in Cu(Sn) Alloy Thin Films
L.A. Clevenger, B. Arcot, W. Ziegler, E.G. Colgan, Q.Z. Hong, F.M. d'Heurle, C. Cabral Jr., T.A. Gallo, J.M.E. Harper
J. Appl. Phys. 83, 90 (1998)

1998

Copper Interconnections and Reliability
C.K. Hu, J.M.E. Harper
Materials Chem. and Phys. 52, 5 (1998)

1997

Microstructure Control in Semiconductor Metallization
J.M.E. Harper, K.P. Rodbell
(Review Article) J. Vac. Sci. Technol. B15, 763 (1997)

1997

Crystallographic Texture of C54 Titanium Disilicide as a Function of Deep Submicron Structure Geometry
V. Svilan, K.P. Rodbell, L.A. Clevenger, C. Cabral Jr., R.A. Roy, I.C. Noyan, C. Lavoie, J. Jordan-Sweet, J.M.E. Harper
J. Elec. Mat. 26, 1090 (1997)

1997

Control of In-Plane Texture of Body Centered Cubic Metal Thin Films
J.M.E. Harper, K.P. Rodbell, E.G. Colgan, R.H. Hammond
J. Appl. Phys. 82, 4319 (1997)

1997

Low Temperature Formation of C54-TiSi2 Using Titanium Alloys
C. Cabral Jr., L.A. Clevenger, J.M.E. Harper, F.M. d'Heurle, R.A. Roy, C. Lavoie, K. Saenger, G.L. Miles, R.W. Mann, J.S. Nakos
Appl. Phys. Lett. 71, 3531 (1997)

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